Cita APA (7a ed.)

Grasser, T. (2014). Bias Temperature Instability for Devices and Circuits. Springer New York : Imprint: Springer. https://doi.org/10.1007/978-1-4614-7909-3

Cita Chicago Style (17a ed.)

Grasser, Tibor. Bias Temperature Instability for Devices and Circuits. New York, NY: Springer New York : Imprint: Springer, 2014. https://doi.org/10.1007/978-1-4614-7909-3.

Cita MLA (9a ed.)

Grasser, Tibor. Bias Temperature Instability for Devices and Circuits. Springer New York : Imprint: Springer, 2014. https://doi.org/10.1007/978-1-4614-7909-3.