TY  - GEN
T1  - Prevention of Electrostatic Discharge Damage of MOS ICs
T2  - Philips Technical Publication, 100
LA  - English
PP  - The Netherlands
PB  - Philips Export B. V.
YR  - 1983
ED  - Philips Electronic Components and Materials
UL  - http://vufind10-pruebas.sigbunlp.bibliotecas.unlp.edu.ar/Record/dfi.21269
KW  - CIRCUITOS INTEGRADOS MOS
ER  -