TY  - GEN
T1  - Highly-Accelerated hunidity Testing of CMOS ICs
T2  - Philips Technical Publication, 249
LA  - English
PP  - The Netherlands
PB  - Philips Export B. V.
YR  - 1987
ED  - Philips Electronic Components and Materials
UL  - http://vufind10-pruebas.sigbunlp.bibliotecas.unlp.edu.ar/Record/dfi.21252
KW  - CIRCUITOS INTEGRADOS CMOS
ER  -